ORCID

Información ORCID de GALINDO RIAÑO, PEDRO LUIS

Biografía

Industry 4.0

Obras

ETLP: event-based three-factor local plasticity for online learning with neuromorphic hardware

2024 | JOURNAL_ARTICLE

DOI: 10.1088/2634-4386/ad6733

Mostrar Detalles

Automatic Software Tailoring for Optimal Performance

2024 | JOURNAL_ARTICLE

DOI: 10.1109/TSUSC.2023.3330671

Mostrar Detalles

Enhancing Fish Auction with Deep Learning and Computer Vision: Automated Caliber and Species Classification

2024 | JOURNAL_ARTICLE

DOI: 10.3390/fishes9040133

Mostrar Detalles

Multi-Signal Multifractal Detrended Fluctuation Analysis for Uncertain Systems —Application to the Energy Consumption of Software Programs in Microcontrollers

2023 | JOURNAL_ARTICLE

DOI: 10.3390/fractalfract7110794

Mostrar Detalles

Unsupervised Learning for the Segmentation of Small Crystalline Particles at the Atomic Level

2023 | JOURNAL_ARTICLE

DOI: 10.1002/crat.202200211

Mostrar Detalles

Bio-plausible digital implementation of a reward modulated STDP synapse

2022 | JOURNAL_ARTICLE

DOI: 10.1007/s00521-022-07220-6

Mostrar Detalles

Calibración ojo a mano de un brazo robótico industrial con cámaras 3D de luz estructurada

2021 | JOURNAL_ARTICLE

DOI: 10.4995/riai.2021.16054

Mostrar Detalles

Modification of the van der Waals interaction at the Bi2Te3 and Ge(111) interface

2021 | JOURNAL_ARTICLE

DOI: 10.1103/PhysRevMaterials.5.024203

EID: 2-s2.0-85101077105

Mostrar Detalles

Anomalous size effect of pt ultrathin nanowires on oxygen reduction reaction

2021 | JOURNAL_ARTICLE

DOI: 10.1021/acs.nanolett.1c03805

EID: 2-s2.0-85119589969

Mostrar Detalles

Online programming system for robotic fillet welding in Industry 4.0

2021 | JOURNAL_ARTICLE

DOI: 10.1108/IR-07-2021-0137

EID: 2-s2.0-85118273756

Mostrar Detalles

Online programming system for robotic fillet welding in Industry 4.0

2021 | OTHER

EID: 2-s2.0-85121786425

Mostrar Detalles

CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

2020 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927620001774

EID: 2-s2.0-85092802970

Mostrar Detalles

Modified qHAADF method for atomic column-by-column compositional quantification of semiconductor heterostructures

2019 | JOURNAL_ARTICLE

DOI: 10.1007/s10853-018-3073-y

EID: 2-s2.0-85056647765

Mostrar Detalles

AL4LA: Active Learning for Text Labeling Based on Paragraph Vectors

2019 | CONFERENCE_PAPER

DOI: 10.1007/978-3-030-20521-8_56

EID: 2-s2.0-85067498494

Mostrar Detalles

Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells

2019 | JOURNAL_ARTICLE

DOI: 10.1016/j.jallcom.2019.04.119

EID: 2-s2.0-85064402597

Mostrar Detalles

HAADF-STEM Image Resolution Enhancement Using High-Quality Image Reconstruction Techniques: Case of the Fe3O₄(111) Surface

2019 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927619014788

EID: 2-s2.0-85071367667

Mostrar Detalles

Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materials

2019 | JOURNAL_ARTICLE

DOI: 10.1111/jmi.12763

EID: 2-s2.0-85056282299

Mostrar Detalles

Predicting the impact of LLVM transformations on software performance,Predicción del impacto de las transformaciones LLVM en el rendimiento del software

2019 | CONFERENCE_PAPER

EID: 2-s2.0-85094684125

Mostrar Detalles

Topological Homogeneity for Electron Microscopy Images

2019 | CONFERENCE_PAPER

DOI: 10.1007/978-3-030-10828-1_13

EID: 2-s2.0-85061099934

Mostrar Detalles

Analyzing the Influence of LLVM Code Optimization Passes on Software Performance

2018 | BOOK_CHAPTER

DOI: 10.1007/978-3-319-91479-4_23

EID: 2-s2.0-85048049663

Mostrar Detalles

Application of Super-Resolution Techniques to Transmission Electron Microscopy Images.

2018 | CONFERENCE_PAPER

DOI: 10.3233/978-1-61499-929-4-42

EID: 2-s2.0-85059624732

Mostrar Detalles

Correcting sample drift using Fourier harmonics

2018 | JOURNAL_ARTICLE

DOI: 10.1016/j.micron.2018.04.004

EID: 2-s2.0-85046114121

Mostrar Detalles

Gaussian kernel density functions for compositional quantification in atom probe tomography

2018 | JOURNAL_ARTICLE

DOI: 10.1016/j.matchar.2018.02.033

EID: 2-s2.0-85042483462

Mostrar Detalles

HAADF-STEM for the analysis of core--shell quantum dots

2018 | JOURNAL_ARTICLE

DOI: 10.1007/s10853-018-2694-5

EID: 2-s2.0-85049321050

Mostrar Detalles

Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells

2018 | JOURNAL_ARTICLE

DOI: 10.1016/j.jallcom.2018.05.333

EID: 2-s2.0-85048418784

Mostrar Detalles

Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images

2018 | BOOK_CHAPTER

DOI: 10.1201/9781351074636

EID: 2-s2.0-85053321291

Mostrar Detalles

Product Matching to Determine the Energy Efficiency of Used Cars Available at Internet Marketplaces

2018 | BOOK_CHAPTER

DOI: 10.1007/978-3-319-62359-7_10

EID: 2-s2.0-85024473928

Mostrar Detalles

Development of a Customized Interface for a Robotic Welding Application at Navantia Shipbuilding Company

2018 | CONFERENCE_PAPER

DOI: 10.1007/978-3-319-70836-2_4

EID: 2-s2.0-85042211069

Mostrar Detalles

Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging

2017 | JOURNAL_ARTICLE

DOI: 10.1016/j.ultramic.2017.07.014

EID: 2-s2.0-85026763984

Mostrar Detalles

Origin of reduced magnetization and domain formation in small magnetite nanoparticles

2017 | JOURNAL_ARTICLE

DOI: 10.1038/srep45997

EID: 2-s2.0-85017344465

Mostrar Detalles

Structural and Compositional Analysis of Core/Shell QDs by Transmission Electron Microscopy Techniques

2017 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927617009503

Mostrar Detalles

Structural characterization of InAlAsSb/InGaAs/InP heterostructures for solar cells

2017 | JOURNAL_ARTICLE

DOI: 10.1016/j.apsusc.2016.07.094

EID: 2-s2.0-85027936688

Mostrar Detalles

Towards Automated Welding in Big Shipbuilding Assisted by Programed Robotic Arm Using a Measuring Arm

2018 | CONFERENCE_PAPER

DOI: 10.1007/978-3-319-70836-2_5

EID: 2-s2.0-85042216970

Mostrar Detalles

Using Deep Learning for Image Similarity in Product Matching

2017 | CONFERENCE_PAPER

DOI: 10.1007/978-3-319-59153-7_25

EID: 2-s2.0-85020523931

Mostrar Detalles

Van der Waals epitaxy between the highly lattice mismatched Cu-doped FeSe and Bi 2 Te 3

2017 | JOURNAL_ARTICLE

DOI: 10.1038/am.2017.111

EID: 2-s2.0-85022205329

Mostrar Detalles

A distributed-memory parallel lattice Kinetic Monte Carlo algorithm for crystal growth applied to barite (001) face

2016 | JOURNAL_ARTICLE

DOI: 10.1002/crat.201600141

EID: 2-s2.0-84987665899

Mostrar Detalles

Quality enhancement and strain measurement in HAADF images using Super-Resolution techniques.

2016 | CONFERENCE_ABSTRACT

Mostrar Detalles

Strain mapping accuracy improvement using super-resolution techniques

2016 | JOURNAL_ARTICLE

DOI: 10.1111/jmi.12341

EID: 2-s2.0-84945254907

Mostrar Detalles

STEM and EELS study of the Graphene/Bi 2 Se 3 Interface

2015 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927615006546

Mostrar Detalles

Synchronous parallel Kinetic Monte Carlo: Implementation and results for object and lattice approaches

2015 | JOURNAL_ARTICLE

DOI: 10.1016/j.nimb.2014.12.081

EID: 2-s2.0-84939975635

Mostrar Detalles

A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

2014 | CONFERENCE_PAPER

DOI: 10.1088/1742-6596/522/1/012013

EID: 2-s2.0-84902996538

Mostrar Detalles

Analysis of electron beam damage of exfoliated MoS₂ sheets and quantitative HAADF-STEM imaging

2014 | JOURNAL_ARTICLE

DOI: 10.1016/j.ultramic.2014.05.004

EID: 2-s2.0-84902355461

Mostrar Detalles

Correlations between atomic structure and giant magnetoresistance ratio in Co₂ (Fe,Mn)Si spin valves

2014 | JOURNAL_ARTICLE

DOI: 10.1088/0022-3727/47/32/322003

EID: 2-s2.0-84904700578

Mostrar Detalles

Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride

2014 | JOURNAL_ARTICLE

DOI: 10.1103/PhysRevLett.113.135503

EID: 2-s2.0-84907510587

Mostrar Detalles

Observation of depth-dependent atomic displacements related to dislocations in GaN by optical sectioning in the STEM

2014 | CONFERENCE_PAPER

DOI: 10.1088/1742-6596/522/1/012048

EID: 2-s2.0-84902981963

Mostrar Detalles

Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics

2014 | JOURNAL_ARTICLE

DOI: 10.1140/epjb/e2014-50052-2

EID: 2-s2.0-84919723286

Mostrar Detalles

Tuning dirac states by strain in the topological insulator bi ₂ se ₃

2014 | JOURNAL_ARTICLE

DOI: 10.1038/nphys2898

EID: 2-s2.0-84897573968

Mostrar Detalles

Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy

2013 | JOURNAL_ARTICLE

DOI: 10.1063/1.4851015

EID: 2-s2.0-84891721219

Mostrar Detalles

Domain matching epitaxial growth of In ₂O ₃ thin films on α-Al ₂O ₃(0001)

2012 | JOURNAL_ARTICLE

DOI: 10.1021/cg201474h

EID: 2-s2.0-84858020639

Mostrar Detalles

Effect Of The Eshelby-Stroh Twist In Dislocations In GaN Imaged End-On

2012 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927612008549

EID: 2-s2.0-85007952738

Mostrar Detalles

High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

2012 | BOOK_CHAPTER

DOI: 10.1007/978-3-642-23351-7_2

EID: 2-s2.0-85020488837

Mostrar Detalles

Quantification of corrugation in simulated graphene by electron tomography techniques

2012 | JOURNAL_ARTICLE

DOI: 10.1063/1.4768701

EID: 2-s2.0-84869988563

Mostrar Detalles

ADART: An adaptive algebraic reconstruction algorithm for discrete tomography

2011 | JOURNAL_ARTICLE

DOI: 10.1109/TIP.2011.2114894

EID: 2-s2.0-79960520848

Mostrar Detalles

Calculation of integrated intensities in aberration-corrected Z-contrast images

2011 | JOURNAL_ARTICLE

DOI: 10.1093/jmicro/dfq078

EID: 2-s2.0-79951612689

Mostrar Detalles

Compositional Mapping by Z-Contrast Imaging

2011 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927611009512

Mostrar Detalles

Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy

2011 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927611000213

EID: 2-s2.0-80054883821

Mostrar Detalles

Distribution of bismuth atoms in epitaxial GaAsBi

2011 | JOURNAL_ARTICLE

DOI: 10.1063/1.3562376

EID: 2-s2.0-79952645546

Mostrar Detalles

Genetic algorithms applied to the design of 3D photonic crystals

2011 | BOOK

DOI: 10.1007/978-3-642-21501-8_36

EID: 2-s2.0-79957949044

Mostrar Detalles

Reduction of Channeling Effects in Aberration-Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes

2011 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927611005800

Mostrar Detalles

Exploring semiconductor quantum dots and wires by high resolution electron microscopy

2010 | CONFERENCE_PAPER

DOI: 10.1088/1742-6596/209/1/012004

EID: 2-s2.0-77950483520

Mostrar Detalles

Morphological evolution of InAs/InP quantum wires through aberration-corrected scanning transmission electron microscopy

2010 | JOURNAL_ARTICLE

DOI: 10.1088/0957-4484/21/32/325706

EID: 2-s2.0-77957308104

Mostrar Detalles

Theoretical modelling of quaternary GaInAsSb/GaAs self-assembled quantum dots

2010 | CONFERENCE_PAPER

DOI: 10.1088/1742-6596/245/1/012081

EID: 2-s2.0-78651228025

Mostrar Detalles

Three-dimensional acoustic lenses with axial symmetry

2010 | JOURNAL_ARTICLE

DOI: 10.1063/1.3474616

EID: 2-s2.0-77955720003

Mostrar Detalles

Through-focal HAADF-STEM of buried nanostructures

2010 | CONFERENCE_PAPER

DOI: 10.1088/1742-6596/209/1/012032

EID: 2-s2.0-77950483258

Mostrar Detalles

Transmission electron microscopy study of vertical quantum dots molecules grown by droplet epitaxy

2010 | JOURNAL_ARTICLE

DOI: 10.1016/j.apsusc.2010.03.024

EID: 2-s2.0-77953324279

Mostrar Detalles

Accuracy assessment of strain mapping from Z -contrast images of strained nanostructures

2009 | JOURNAL_ARTICLE

DOI: 10.1063/1.3243990

EID: 2-s2.0-70349922931

Mostrar Detalles

Astrometric positioning of geostationary satellites (PASAGE)

2009 | CONFERENCE_PAPER

EID: 2-s2.0-70749107492

Mostrar Detalles

Astrometric positioning of geostationary satellites (PASAGE)

2009 | JOURNAL_ARTICLE

Mostrar Detalles

Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

2009 | JOURNAL_ARTICLE

DOI: 10.1103/PhysRevB.80.125211

EID: 2-s2.0-70350646937

Mostrar Detalles

Column-by-column compositional mapping by Z-contrast imaging

2009 | JOURNAL_ARTICLE

DOI: 10.1016/j.ultramic.2008.10.008

EID: 2-s2.0-57849100000

Mostrar Detalles

Direct observation of a surface induced disordering process in magnetic nanoparticles

2009 | JOURNAL_ARTICLE

DOI: 10.1103/PhysRevLett.103.115703

EID: 2-s2.0-70349109102

Mostrar Detalles

Erratum to: "Column-by-column compositional mapping by Z-contrast imaging" [Ultramicroscopy 109(2) (2009) 172-176] (DOI:10.1016/j.ultramic.2008.10.008)

2009 | JOURNAL_ARTICLE

DOI: 10.1016/j.ultramic.2009.06.008

EID: 2-s2.0-68749093801

Mostrar Detalles

High resolution electron microscopy of GaAs capped GaSb nanostructures

2009 | JOURNAL_ARTICLE

DOI: 10.1063/1.3077009

EID: 2-s2.0-59349104384

Mostrar Detalles

High resolution peak measurement and strain mapping using peak pairs analysis

2009 | JOURNAL_ARTICLE

Mostrar Detalles

Two-dimensional imaging of III-V quantum dots confinement potential

2009 | JOURNAL_ARTICLE

DOI: 10.1209/0295-5075/88/66003

EID: 2-s2.0-77954184724

Mostrar Detalles

A method to determine the strain and nucleation sites of stacked nano-objects

2008 | JOURNAL_ARTICLE

DOI: 10.1166/jnn.2008.123

EID: 2-s2.0-54149109849

Mostrar Detalles

Experimental and simulated strain field maps in stacked quantum wires

2008 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927608087084

EID: 2-s2.0-49549094479

Mostrar Detalles

HAADF-STEM image simulation of large scale nanostructures

2008 | CONFERENCE_PAPER

DOI: 10.1007/978-3-540-85156-1_56

Mostrar Detalles

High resolution HAADF-STEM imaging analysis of N related defects in GaNAs quantum wells

2008 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927608082329

EID: 2-s2.0-49549095136

Mostrar Detalles

Influence of atomic displacements due to elastic strain in HAADF-STEM simulated images

2008 | CONFERENCE_PAPER

DOI: 10.1007/978-3-540-85156-1_58

Mostrar Detalles

PPA: An Improved Implementation of Peak Pairs procedure as a DM plug-in for Strain Mapping

2008 | CONFERENCE_PAPER

DOI: 10.1007/978-3-540-85156-1_63

Mostrar Detalles

Prediction models of CO, SPM and SO₂ concentrations in the Campo de Gibraltar Region, Spain: A multiple comparison strategy

2008 | JOURNAL_ARTICLE

DOI: 10.1007/s10661-007-9963-0

EID: 2-s2.0-47349111557

Mostrar Detalles

Prediction of CO maximum ground level concentrations in the Bay of Algeciras, Spain using artificial neural networks

2008 | JOURNAL_ARTICLE

DOI: 10.1016/j.chemosphere.2007.08.039

EID: 2-s2.0-37549000626

Mostrar Detalles

Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures

2008 | JOURNAL_ARTICLE

DOI: 10.1063/1.2998656

EID: 2-s2.0-54149090886

Mostrar Detalles

TEM characterization of InAs/GaAs quantum dots capped by a GaSb/GaAs layer

2008 | CONFERENCE_PAPER

DOI: 10.1007/978-3-540-85226-1_23

Mostrar Detalles

Error Quantification in Strain Mapping Methods

2007 | JOURNAL_ARTICLE

DOI: 10.1017/s1431927607070407

Mostrar Detalles

Critical strain region evaluation of self-assembled semiconductor quantum dots

2007 | JOURNAL_ARTICLE

DOI: 10.1088/0957-4484/18/47/475503

EID: 2-s2.0-35748951609

Mostrar Detalles

Determination of the strain field in nano-objects from aberration-corrected Z-contrast images

2007 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927607074971

Mostrar Detalles

Direct imaging of quantum wires nucleated at diatomic steps

2007 | JOURNAL_ARTICLE

DOI: 10.1063/1.2790483

EID: 2-s2.0-34948840547

Mostrar Detalles

Error quantification in strain mapping methods

2007 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927607070407

EID: 2-s2.0-34948885612

Mostrar Detalles

Incorporation of Sb in InAsGaAs quantum dots

2007 | JOURNAL_ARTICLE

DOI: 10.1063/1.2826546

EID: 2-s2.0-37549022212

Mostrar Detalles

The Peak Pairs algorithm for strain mapping from HRTEM images

2007 | JOURNAL_ARTICLE

DOI: 10.1016/j.ultramic.2007.01.019

EID: 2-s2.0-34548329658

Mostrar Detalles

A competitive neural network approach for meteorological situation clustering

2006 | JOURNAL_ARTICLE

DOI: 10.1016/j.atmosenv.2005.09.065

EID: 2-s2.0-29144484834

Mostrar Detalles

An approach to the systematic distortion correction in aberration-corrected HAADF images

2006 | JOURNAL_ARTICLE

DOI: 10.1111/j.1365-2818.2006.01533.x

EID: 2-s2.0-33645226591

Mostrar Detalles

Determination of the strain generated in InAs/InP quantum wires: prediction of nucleation sites

2006 | JOURNAL_ARTICLE

DOI: 10.1088/0957-4484/17/22/020

EID: 2-s2.0-33846056055

Mostrar Detalles

Quantitative strain mapping applied to aberration-corrected HAADF images

2006 | JOURNAL_ARTICLE

DOI: 10.1017/S1431927606060363

EID: 2-s2.0-33746254034

Mostrar Detalles

Modelling the effective thermal conductivity of an unidirectional composite by the use of artificial neural networks

2005 | JOURNAL_ARTICLE

DOI: 10.1016/j.compscitech.2004.09.018

EID: 2-s2.0-11344288986

Mostrar Detalles

Quantification of the influence of TEM operation parameters on the error of HREM image matching

2005 | OTHER

DOI: 10.1007/3-540-31915-8_39

Parte de ISBN: 978-3-540-31914-6

Mostrar Detalles

Statistical Ensemble Method (SEM): A new meta-machine learning approach based on statistical techniques

2005 | CONFERENCE_PAPER

DOI: 10.1007/11494669_24

EID: 2-s2.0-25144508821

Mostrar Detalles

Strain mapping from HRTEM images

2005 | BOOK_CHAPTER

Mostrar Detalles

Model selection methods in Multilayer Perceptions

2004 | CONFERENCE_PAPER

DOI: 10.1109/IJCNN.2004.1380072

EID: 2-s2.0-10944273406

Mostrar Detalles

Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images

2004 | BOOK

EID: 2-s2.0-7744227880

Mostrar Detalles

A new penalty-based criterion for model selection in regularized nonlinear models

2003 | BOOK

EID: 2-s2.0-35248869642

Mostrar Detalles

Application of neural techniques to the modelling of time-series of atmospheric pollution data in the campo de Gibraltar region

2003 | CONFERENCE_PAPER

Mostrar Detalles

Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images

2003 | BOOK_CHAPTER

Mostrar Detalles

Empirical performance assessment of nonlinear model selection techniques

2002 | BOOK

DOI: 10.5555/645991.674661

EID: 2-s2.0-79952258197

Mostrar Detalles

Multiple comparison procedures applied to model selection

2002 | JOURNAL_ARTICLE

DOI: 10.1016/S0925-2312(01)00653-1

EID: 2-s2.0-0036825523

Mostrar Detalles

Noise derived information criterion for model selection.

2002 | CONFERENCE_PAPER

Mostrar Detalles

ON THE APPLICATION OF ADVANCED COMPUTING TECHNIQUES TO THE DETERMINATION OF THICKNESS AND DEFOCUS FROM HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY IMAGES

2002 | CONFERENCE_PAPER

Mostrar Detalles

Pattern recognition approach to quantitative description of the microstructure of disordered composites for estimation of thermal conductivity

2002 | JOURNAL_ARTICLE

DOI: 10.1515/SECM.2002.10.2.91

EID: 2-s2.0-0036411164

Mostrar Detalles

A penalization criterion based on noise behaviour for model selection

2001 | BOOK

DOI: 10.1007/3-540-45723-2_18

EID: 2-s2.0-84880941135

Mostrar Detalles

Repeated measures multiple comparison procedures applied to model selection in neural networks

2001 | BOOK

DOI: 10.1007/3-540-45723-2_10

EID: 2-s2.0-84902202785

Mostrar Detalles

A statistical model selection strategy applied to neural networks

2000 | CONFERENCE_PAPER

Mostrar Detalles

Multiple comparison procedures for determining the optimal complexity of a model

2000 | BOOK

DOI: 10.1007/3-540-44522-6_82

EID: 2-s2.0-84877783240

Mostrar Detalles

A competitive algorithm for training HMM for speech recognition

1995 | CONFERENCE_PAPER

Mostrar Detalles

Competitive forward-backward algorithm (CFB)

1995 | CONFERENCE_PAPER

EID: 2-s2.0-0029210123

Mostrar Detalles

The competitive forward-backward algorithm (CFB)

1995 | JOURNAL_ARTICLE

DOI: 10.1049/cp:19950533

Mostrar Detalles

Unsupervised Competitive Learning Applied to High Level Speech Noise Cancellation

1994 | CONFERENCE_PAPER

Mostrar Detalles

High Level Speech Processing by Competitive Neural Networks From Psychology to Simulation

1990 | BOOK_CHAPTER

Parte de ISBN: 978-3-642-76153-9

Mostrar Detalles

A Statistical Model Selection Strategy Applied to Neural Networks

| CONFERENCE_PAPER

Mostrar Detalles

A complete methodology for the simulation of large nanostructures and quantitative analysis using Z-contrast images

| CONFERENCE_PAPER

Mostrar Detalles

A methodology for determining the optimal Gaussian function to correct the effect of spatial incoherence in Z-contrast images

| CONFERENCE_PAPER

Mostrar Detalles

Determining the Optimal Regression Model to Estimate Transversal Effective Thermal Conductivity of an Unidirectional Composite

Determining the Optimal Regression Model to Estimate Transversal Effective Thermal Conductivity of an Unidirectional Composite | CONFERENCE_PAPER

Mostrar Detalles

Efectos de la Regularización en la Selección de Modelos con NNDIC

| MANUAL

Mostrar Detalles

Electron tomography simulations of graphene

| CONFERENCE_PAPER

Mostrar Detalles

Experimental observation of the Eshelby-Stroh twist in dislocations in GaN imaged end-on

| CONFERENCE_PAPER

Mostrar Detalles

La Cuantificación Vectorial

| OTHER

Mostrar Detalles

Simulación Kinetic Monte Carlo de Crecimiento Epitaxial

| JOURNAL_ARTICLE

Mostrar Detalles

Simulación MSKMC de Crecimiento Epitaxial de Puntos Cuánticos

| JOURNAL_ARTICLE

Mostrar Detalles

Tomography through Points applied to accurate 3D reconstruction of Graphene-like structures

| CONFERENCE_PAPER

Mostrar Detalles

Política de Cookies

Personalización de Cookies

Información ORCID de GALINDO RIAÑO, PEDRO LUIS

Biografía

Obras

ETLP: event-based three-factor local plasticity for online learning with neuromorphic hardware

Automatic Software Tailoring for Optimal Performance

Enhancing Fish Auction with Deep Learning and Computer Vision: Automated Caliber and Species Classification

Multi-Signal Multifractal Detrended Fluctuation Analysis for Uncertain Systems —Application to the Energy Consumption of Software Programs in Microcontrollers

Unsupervised Learning for the Segmentation of Small Crystalline Particles at the Atomic Level

Bio-plausible digital implementation of a reward modulated STDP synapse

Calibración ojo a mano de un brazo robótico industrial con cámaras 3D de luz estructurada

Modification of the van der Waals interaction at the Bi2Te3 and Ge(111) interface

Anomalous size effect of pt ultrathin nanowires on oxygen reduction reaction

Online programming system for robotic fillet welding in Industry 4.0

Online programming system for robotic fillet welding in Industry 4.0

CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

Modified qHAADF method for atomic column-by-column compositional quantification of semiconductor heterostructures

AL4LA: Active Learning for Text Labeling Based on Paragraph Vectors

Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells

HAADF-STEM Image Resolution Enhancement Using High-Quality Image Reconstruction Techniques: Case of the Fe3O4(111) Surface

Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materials

Predicting the impact of LLVM transformations on software performance,Predicción del impacto de las transformaciones LLVM en el rendimiento del software

Topological Homogeneity for Electron Microscopy Images

Analyzing the Influence of LLVM Code Optimization Passes on Software Performance

Application of Super-Resolution Techniques to Transmission Electron Microscopy Images.

Correcting sample drift using Fourier harmonics

Gaussian kernel density functions for compositional quantification in atom probe tomography

HAADF-STEM for the analysis of core--shell quantum dots

Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells

Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images

Product Matching to Determine the Energy Efficiency of Used Cars Available at Internet Marketplaces

Development of a Customized Interface for a Robotic Welding Application at Navantia Shipbuilding Company

Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging

Origin of reduced magnetization and domain formation in small magnetite nanoparticles

Structural and Compositional Analysis of Core/Shell QDs by Transmission Electron Microscopy Techniques

Structural characterization of InAlAsSb/InGaAs/InP heterostructures for solar cells

Towards Automated Welding in Big Shipbuilding Assisted by Programed Robotic Arm Using a Measuring Arm

Using Deep Learning for Image Similarity in Product Matching

Van der Waals epitaxy between the highly lattice mismatched Cu-doped FeSe and Bi 2 Te 3

A distributed-memory parallel lattice Kinetic Monte Carlo algorithm for crystal growth applied to barite (001) face

Quality enhancement and strain measurement in HAADF images using Super-Resolution techniques.

Strain mapping accuracy improvement using super-resolution techniques

STEM and EELS study of the Graphene/Bi 2 Se 3 Interface

Synchronous parallel Kinetic Monte Carlo: Implementation and results for object and lattice approaches

A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging

Correlations between atomic structure and giant magnetoresistance ratio in Co2 (Fe,Mn)Si spin valves

Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride

Observation of depth-dependent atomic displacements related to dislocations in GaN by optical sectioning in the STEM

Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics

Tuning dirac states by strain in the topological insulator bi 2 se 3

Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy

Domain matching epitaxial growth of In 2O 3 thin films on α-Al 2O 3(0001)

Effect Of The Eshelby-Stroh Twist In Dislocations In GaN Imaged End-On

High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

Quantification of corrugation in simulated graphene by electron tomography techniques

ADART: An adaptive algebraic reconstruction algorithm for discrete tomography

Calculation of integrated intensities in aberration-corrected Z-contrast images

Compositional Mapping by Z-Contrast Imaging

Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy

Distribution of bismuth atoms in epitaxial GaAsBi

Genetic algorithms applied to the design of 3D photonic crystals

Reduction of Channeling Effects in Aberration-Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes

Exploring semiconductor quantum dots and wires by high resolution electron microscopy

Morphological evolution of InAs/InP quantum wires through aberration-corrected scanning transmission electron microscopy

Theoretical modelling of quaternary GaInAsSb/GaAs self-assembled quantum dots

Three-dimensional acoustic lenses with axial symmetry

Through-focal HAADF-STEM of buried nanostructures

Transmission electron microscopy study of vertical quantum dots molecules grown by droplet epitaxy

Accuracy assessment of strain mapping from Z -contrast images of strained nanostructures

Astrometric positioning of geostationary satellites (PASAGE)

Astrometric positioning of geostationary satellites (PASAGE)

Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

Column-by-column compositional mapping by Z-contrast imaging

Direct observation of a surface induced disordering process in magnetic nanoparticles

Erratum to: "Column-by-column compositional mapping by Z-contrast imaging" [Ultramicroscopy 109(2) (2009) 172-176] (DOI:10.1016/j.ultramic.2008.10.008)

High resolution electron microscopy of GaAs capped GaSb nanostructures

High resolution peak measurement and strain mapping using peak pairs analysis

Two-dimensional imaging of III-V quantum dots confinement potential

HAADF-STEM Image Resolution Enhancement Using High-Quality Image Reconstruction Techniques: Case of the Fe3O₄(111) Surface

Analysis of electron beam damage of exfoliated MoS₂ sheets and quantitative HAADF-STEM imaging

Correlations between atomic structure and giant magnetoresistance ratio in Co₂ (Fe,Mn)Si spin valves

Tuning dirac states by strain in the topological insulator bi ₂ se ₃

Domain matching epitaxial growth of In ₂O ₃ thin films on α-Al ₂O ₃(0001)

Prediction models of CO, SPM and SO₂ concentrations in the Campo de Gibraltar Region, Spain: A multiple comparison strategy